EE130 Homeworks
Spring 2007
(Word format)
Homework #1: Crystal structure; carrier concentrations; doping
Assignment (due 1/29/07)
Solution
Homework #2: Carrier energy distributions; energy band diagram; dopant freezeout; carrier drift
Assignment (due 2/5/07)
Solution
Homework #3: Mobility temperature dependence; band diagram, electrostatic potential, and E-field; minority carrier diffusion equations; quasi-Fermi levels
Assignment (due 2/12/07)
Solution

Homework #4: Metal-semiconductor contacts: energy-band diagrams, electrostatics, I-V characteristics
Assignment (due 2/21/07)
Solution

Homework #5: Practical ohmic contacts; MS junction small-signal capacitance; pn junction electrostatics
Assignment (due 2/26/07)
Solution

Homework #6: pn junctions: carrier concentration profiles, current distributions, I-V characteristics, reverse breakdown
Assignment (due 3/5/07)
Solution (updated 3/6/07)

Homework #7: pn junctions: non-ideal behavior, small signal model, transient response; short-base diode
Assignment (updated 3/6/06, due 3/12/07)
Solution (updated 3/13/06)

Homework #8: optoelectronic diodes; BJT electrostatics; BJT performance parameters; project preparation
Assignment -- Problem 4 updated 4/20/07
Solution (updated 3/22/07)

Homework #9: BJT current components and performance parameters; Ebers-Moll model; BJT deviations from the ideal
Assignment (updated 3/22/07)
Solution (updated 4/4/07)

Homework #10: BJT small signal model; BJT transient response; thyristor
Assignment
Solution

Homework #11: MOS capacitor: fundamentals, charge density, capacitance
Assignment
Solution

Homework #12: MOS capacitor: oxide charges, non-idealities, VT adjustment
Assignment
Solution

Homework #13: MOSFET: inversion charge density, long-channel I-V, body biasing, transconductance
Assignment
Solution

Homework #14: MOSFET: subthreshold leakage; velocity saturation; short channel effect; source/drain structure
Assignment -- updated 5/2/07
Solution

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 Last updated 5/2/07