The laboratory in 353 Cory supports a junior-level, core microelectronics course using the new text Microelectronics: An Integrated Approach, by R. T. Howe and C. G. Sodini (Prentice Hall, 1997). Devices are characterized fully using HP 4155 A/B Parameter Analyzers and circuits based on integrated embodiments of these devices on chips are characterized for performance. To facilitate this comparison of devices and circuits a special set of 6 chips has been designed at UC Berkeley in collaboration with Micro Linear in a 1.5 micron BiCMOS tile array technology. The Lab Chips include "bare," accessible versions of the core IC analog and digital circuit building blocks that are introduced in the lectures. Therefore, the lab experiments serve to reinforce the lectures and vice versa.
A total of 11 weekly laboratories will be used this semester including an introductory laboratory on the use of the device characterization equipment.
A reader including the Laboratory Manual and solutions to even exercises in the textbook is now available from:
Copy Central (Southside)It is reader #165 and sells for $15.09+tax.
2560 Bancroft Way
(510) 848-8649
Experiment 1 - The Curve Tracer
Experiment 2 - Introduction to Electronic Test Equipment
Experiment 3 - IC Resistors
Experiment 4 - Introduction to PSPICE
Experiment 5 - MOS Device Characterization
Experiment 6 - Bipolar Junction Transistor Characteristics
Experiment 7 - Single Stage Amplifiers with Passive Loads - MOS
Experiment 8 - Single Stage Amplifiers with Passive Loads - BJT
Experiment 9 - Frequency Response
Experiment 10 - Multistage Amplifiers
Experiment 11 - Current and Voltage Sources
Acknowledgments
Many people from Berkeley have made significant
contributions to the development of the Lab Chips in collaboration with Micro
Linear. These chips and the laboratory manual have been made available in the
public domain. See the laboratory manual and the course resource web pages for
more detail.